- Title
- Dead-time issues in predictive current control
- Creator
- Summers, Terrence J.; Betz, Robert E.
- Relation
- IEEE Transactions on Industry Applications Vol. 40, Issue 3, p. 835-844
- Publisher Link
- http://dx.doi.org/10.1109/TIA.2004.827772
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Resource Type
- journal article
- Date
- 2004
- Description
- Current control in inverter-driven machine systems is the inner most component of the hierarchy of control loops. If the control of current in the machine is not fast and accurate then it is difficult, if not impossible, to build a high-performance drive system. Unfortunately, the implementation of current control in power electronic systems is not ideal. Practical effects can have a significant influence on its performance. This paper examines one of these effects, dead time, and considers the influence it has on the performance of predictive current controllers (PCCs). The paper presents analysis that shows that a PCC implicitly compensates for voltage loss due to dead time. Also, a modified PCC is introduced that reduces the zero-current-clamp problem caused by dead time. Simulation and experimental results are presented to verify the analysis and confirm the performance of the new algorithm.
- Subject
- current clamp; inverter dead time; predictive current controller
- Identifier
- http://hdl.handle.net/1959.13/27566
- Identifier
- uon:1800
- Identifier
- ISSN:0093-9994
- Rights
- Copyright © 2004 IEEE. Reprinted from IEEE Transactions on Industry Applications, 40, 3, 835-844. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Newcastle's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
- Language
- eng
- Full Text
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